Focused-helium-ion-beam blow forming of nanostructures: radiation damage and nanofabrication
نویسندگان
چکیده
منابع مشابه
Nanofabrication and Spectroscopy of Magnetic Nanostructures Using a Focused Ion Beam
DOI: 10.25148/etd.FIDC000785 Follow this and additional works at: http://digitalcommons.fiu.edu/etd Part of the Biological Factors Commons, Biology and Biomimetic Materials Commons, Biomedical Devices and Instrumentation Commons, Chemical and Pharmacologic Phenomena Commons, Circulatory and Respiratory Physiology Commons, Electrical and Electronics Commons, Electromagnetics and Photonics Common...
متن کاملFocused Ion Beam Direct Write Nanofabrication of Surface Phonon Polariton Metamaterial Nanostructures
Beyond the capabilities for sample characterization via TEM liftout and 3-D sectioning, the focused ion beam microscope (FIB) is useful tool for direct-write lithography of novel materials structures. It has unique control in varying the depth of structure feature through beam and dose control. Because of this, FIB may be used to exploit 3-D resonant modes in metamaterial nanostructures in ways...
متن کاملNanofabrication with a Helium Ion Microscope
The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well as a mechanism for very precise nanofabrication [...
متن کاملOne-step Nanofabrication of Diffractive Structure via Focused Ion Beam Scanning on Glass
A diffractive structure was obtained by directly scanning on a glass substrate in an area of 25×20 μm by use of focused ion beam (FIB) with energy of 30 keV and beam current of 1 nA. It is a one-step, and pattern transfer free process. Ripples with regular shape and geometric size were observed on glass after FIB scanning. The ripples can be used as diffractive grating. Wavelength and amplitude...
متن کاملNanofabrication by advanced electron microscopy using intense and focused beam∗.
The nanogrowth and nanofabrication of solid substances using an intense and focused electron beam are reviewed in terms of the application of scanning and transmission electron microscopy (SEM, TEM and STEM) to control the size, position and structure of nanomaterials. The first example discussed is the growth of freestanding nanotrees on insulator substrates by TEM. The growth process of the n...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Nanotechnology
سال: 2019
ISSN: 0957-4484,1361-6528
DOI: 10.1088/1361-6528/ab4a65